Institute for Communication Technologies and Embedded Systems

A SW performance estimation framework for early System-Level-Design using fine-grained instrumentation

Authors:
Kempf, T. ,  Karuri, K. ,  Wallentowitz, S. ,  Ascheid, G.Leupers, R.Meyr, H.
in Design, Automation & Test in Europe (DATE)
Book Title:
Design, Automation & Test in Europe (DATE)
Address:
Munich, Germany
Date:
Mar. 2006
Language:
English
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