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Fine-grained Application Source Code Profiling for ASIP Design

Authors:: Karuri, K. , Al Faruque, M. A. , Kraemer, S. , Leupers, R. , Ascheid, G. , Meyr, H.
Book Title:: 42nd Design Automation Conference
Address:: Anaheim, California, USA
Date:: Jun. 2005
Language:: English
Download:: BibTeX
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