Debugging Concurrent MPSoC Software with Bug Pattern Descriptions

Authors:
Luis Gabriel Murillo, W. Zhou, Juan Fernando Eusse, Rainer Leupers, and Gerd Ascheid
Book Title:
System, Software, SoC and Silicon Debug Conference (S4D)
Address:
Munich, Germany
Date:
Oct. 2011
Language:
English

Abstract

As MPSoCs become key components for the electronics industry, the programmability problem poses an ever increasing burden on the software development process. In addition to the difficulty of writing parallel applications, concurrency bugs are usually hard to find, understand and reproduce. Programmers writing parallel software need more support from the debugging tools in order to understand harmful effects of concurrent interactions.

This paper introduces a debugger framework that detects concurrency bugs dynamically, based on user defined bug pattern descriptions. The framework can be configured to address different MPSoCs and different low-level APIs.

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murilloS4D11.pdf 149 K

BibTeX

@inproceedings{murilloS4D11,
author = {Luis Gabriel Murillo, W. Zhou, Juan Fernando Eusse, Rainer Leupers, and Gerd Ascheid},
booktitle = {System, Software, SoC and Silicon Debug Conference (S4D)},
title = {Debugging Concurrent MPSoC Software with Bug Pattern Descriptions},
year = {2011},
month = {oct},
address = {Munich, Germany},
}

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